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Effects of intermittent faults on the reliability of a Reduced Instruction Set Computing (RISC) microprocessor

Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro (Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)

With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...
Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System

Gil Tomás, Daniel Antonio; Gracia Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz Adalid, Luis José; Gil Vicente, Pedro Joaquín (Institute of Electrical and Electronics Engineers (IEEE), 2016-06)

As scaling is more and more aggressive, intermittent faults are increasing their importance in current deep submicron complementary metal-oxide-semiconductor (CMOS) technologies. This work shows the dependability assessment ...
The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs

Espinosa García, Jaime; Andrés Martínez, David de; Ruiz, Juan Carlos; Gil, Pedro (Springer, 2013)

Current integration scales are increasing the number and types of faults that embedded systems must face. Traditional approaches focus on dealing with those transient and permanent faults that impact the state or output ...

Now showing items 1-3 of 3