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Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters

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Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters

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dc.contributor.author Reig, Juan es_ES
dc.contributor.author Rubio Arjona, Lorenzo es_ES
dc.contributor.author Cardona Marcet, Narciso es_ES
dc.date.accessioned 2018-11-29T10:23:25Z
dc.date.available 2018-11-29T10:23:25Z
dc.date.issued 2005-02-14
dc.identifier.isbn 0-7803-8256-0
dc.identifier.issn 1550-2252
dc.identifier.uri http://hdl.handle.net/10251/113320
dc.description.abstract [EN] In this paper, an infinite convergent series for outage probabilities of dual selection combiners (SC) in a correlated Nakagami fading with arbitrary fading parameters (not necessary identical) is derived. Moments of signal-to-noise ratio (SNR) and diversity gain at the output of the combiner are analyzed. The influence of the correlation coefficient on the outage probability is also presented. es_ES
dc.format.extent 4 es_ES
dc.language Inglés es_ES
dc.publisher IEEE es_ES
dc.relation.ispartof 2004 IEEE 59th Vehicular Technology Conference. VTC 2004-Spring es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Diversity es_ES
dc.subject Fading channels es_ES
dc.subject.classification TEORIA DE LA SEÑAL Y COMUNICACIONES es_ES
dc.title Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters es_ES
dc.type Capítulo de libro es_ES
dc.type Comunicación en congreso es_ES
dc.identifier.doi 10.1109/VETECS.2004.1387976
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions es_ES
dc.description.bibliographicCitation Reig, J.; Rubio Arjona, L.; Cardona Marcet, N. (2005). Outage probabilities of dual selection combiners in a correlated Nakagami fading with arbitrary fading parameters. En 2004 IEEE 59th Vehicular Technology Conference. VTC 2004-Spring. IEEE. 367-370. doi:10.1109/VETECS.2004.1387976 es_ES
dc.description.accrualMethod S es_ES
dc.relation.conferencename 59 th IEEE Vehicular Technology Conference (VTC9 es_ES
dc.relation.conferencedate Mayo 17-19,2004 es_ES
dc.relation.conferenceplace Milán, Italia es_ES
dc.relation.publisherversion http://doi.org/10.1109/VETECS.2004.1387976 es_ES
dc.description.upvformatpinicio 367 es_ES
dc.description.upvformatpfin 370 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 1
dc.relation.pasarela S\80253 es_ES


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