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A Test Vector Generation Method Based on Symbol Error Probabilities for Low-Complexity Chase Soft-Decision Reed-Solomon Decoding

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A Test Vector Generation Method Based on Symbol Error Probabilities for Low-Complexity Chase Soft-Decision Reed-Solomon Decoding

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Valls Coquillat, J.; Torres Carot, V.; Canet Subiela, MJ.; García-Herrero, FM. (2019). A Test Vector Generation Method Based on Symbol Error Probabilities for Low-Complexity Chase Soft-Decision Reed-Solomon Decoding. IEEE Transactions on Circuits and Systems I Regular Papers. 66(6):2198-2207. https://doi.org/10.1109/TCSI.2018.2882876

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/157302

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Title: A Test Vector Generation Method Based on Symbol Error Probabilities for Low-Complexity Chase Soft-Decision Reed-Solomon Decoding
Author: Valls Coquillat, Javier Torres Carot, Vicente Canet Subiela, Mª José García-Herrero, Francisco M.
UPV Unit: Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica
Issued date:
Abstract:
[EN] This paper presents a low-complexity chase (LCC) decoder for Reed-Solomon (RS) codes, which uses a novel method for the selection of test vectors that is based on the analysis of the symbol error probabilities derived ...[+]
Subjects: Reed-Solomon , Algebraic soft-decision , Low-complexity chase , Error correction
Copyrigths: Reserva de todos los derechos
Source:
IEEE Transactions on Circuits and Systems I Regular Papers. (issn: 1549-8328 )
DOI: 10.1109/TCSI.2018.2882876
Publisher:
Institute of Electrical and Electronics Engineers
Publisher version: https://doi.org/10.1109/TCSI.2018.2882876
Project ID:
MINISTERIO DE ECONOMIA Y EMPRESA/TEC2015-70858-C2-2-R
Description: © 2019 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Thanks:
This work was supported by the Spanish Ministerio de Economia y Competitividad and FEDER under Grant TEC2015-70858-C2-2-R. This paper was recommended by Associate Editor M. Boukadoum.
Type: Artículo

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