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Nonintrusive Characterization Method for Integrated Optical Delay Lines

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Nonintrusive Characterization Method for Integrated Optical Delay Lines

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Martínez-Carrasco, P.; Huy-Ho, T.; Capmany Francoy, J. (2024). Nonintrusive Characterization Method for Integrated Optical Delay Lines. Journal of Lightwave Technology. 42(14):4844-4850. https://doi.org/10.1109/JLT.2024.3380637

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/209277

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Title: Nonintrusive Characterization Method for Integrated Optical Delay Lines
Author: Martínez-Carrasco, Pablo Huy-Ho, Tan Capmany Francoy, José
UPV Unit: Universitat Politècnica de València. Instituto Universitario de Telecomunicación y Aplicaciones Multimedia - Institut Universitari de Telecomunicacions i Aplicacions Multimèdia
Universitat Politècnica de València. Escuela Técnica Superior de Ingenieros de Telecomunicación - Escola Tècnica Superior d'Enginyers de Telecomunicació
Issued date:
Abstract:
[EN] In this work we present an automatic calibration technique for switched Optical True Time Delay Lines which allows the control of all of the switchers without relaying on intermediate attenuators nor external test ...[+]
Subjects: Delays , Optical filters , Optical switches , Optical attenuators , Optical interferometry , Delay lines , Optical sensors , Beamforming networks , Microwave photonics , Silicon photonics , True time delay
Copyrigths: Reconocimiento - No comercial - Sin obra derivada (by-nc-nd)
Source:
Journal of Lightwave Technology. (issn: 0733-8724 )
DOI: 10.1109/JLT.2024.3380637
Publisher:
Institute of Electrical and Electronics Engineers
Publisher version: https://doi.org/10.1109/JLT.2024.3380637
Project ID:
info:eu-repo/grantAgreement/Huawei Technologies Canada Co., Ltd.//YB20200065124/
Thanks:
This work was supported by Huawei under Contract YB20200065124.
Type: Artículo

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