Martínez-Carrasco, P.; Huy-Ho, T.; Capmany Francoy, J. (2024). Nonintrusive Characterization Method for Integrated Optical Delay Lines. Journal of Lightwave Technology. 42(14):4844-4850. https://doi.org/10.1109/JLT.2024.3380637
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/209277
Title:
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Nonintrusive Characterization Method for Integrated Optical Delay Lines
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Author:
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Martínez-Carrasco, Pablo
Huy-Ho, Tan
Capmany Francoy, José
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UPV Unit:
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Universitat Politècnica de València. Instituto Universitario de Telecomunicación y Aplicaciones Multimedia - Institut Universitari de Telecomunicacions i Aplicacions Multimèdia
Universitat Politècnica de València. Escuela Técnica Superior de Ingenieros de Telecomunicación - Escola Tècnica Superior d'Enginyers de Telecomunicació
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Issued date:
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Abstract:
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[EN] In this work we present an automatic calibration technique for switched Optical True Time Delay Lines which allows the control of all of the switchers without relaying on intermediate attenuators nor external test ...[+]
[EN] In this work we present an automatic calibration technique for switched Optical True Time Delay Lines which allows the control of all of the switchers without relaying on intermediate attenuators nor external test ports, thus optimizing the number of active elements on chip and the footprint. This technique has been used for the characterization of a delay line fabricated on a silicon photonic chip.The accuracy and reliability of this technique were validated for applications beyond beamforming by utilizing the calibration data to synthesize variable optical interleavers.
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Subjects:
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Delays
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Optical filters
,
Optical switches
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Optical attenuators
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Optical interferometry
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Delay lines
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Optical sensors
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Beamforming networks
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Microwave photonics
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Silicon photonics
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True time delay
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Copyrigths:
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Reconocimiento - No comercial - Sin obra derivada (by-nc-nd)
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Source:
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Journal of Lightwave Technology. (issn:
0733-8724
)
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DOI:
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10.1109/JLT.2024.3380637
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Publisher:
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Institute of Electrical and Electronics Engineers
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Publisher version:
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https://doi.org/10.1109/JLT.2024.3380637
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Project ID:
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info:eu-repo/grantAgreement/Huawei Technologies Canada Co., Ltd.//YB20200065124/
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Thanks:
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This work was supported by Huawei under Contract YB20200065124.
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Type:
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Artículo
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