Nonintrusive Characterization Method for Integrated Optical Delay Lines

Abstract

[EN] In this work we present an automatic calibration technique for switched Optical True Time Delay Lines which allows the control of all of the switchers without relaying on intermediate attenuators nor external test ports, thus optimizing the number of active elements on chip and the footprint. This technique has been used for the characterization of a delay line fabricated on a silicon photonic chip.The accuracy and reliability of this technique were validated for applications beyond beamforming by utilizing the calibration data to synthesize variable optical interleavers.