Reig, J.; Rubio Arjona, L. (2011). On Simple Estimators of the alpha-mu Fading Distribution. IEEE Transactions on Communications. 59(12):3254-3258. doi:10.1109/TCOMM.2011.080111.090223
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/50794
Title:
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On Simple Estimators of the alpha-mu Fading Distribution
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Author:
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Reig, Juan
Rubio Arjona, Lorenzo
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UPV Unit:
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Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
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Issued date:
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Abstract:
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In this letter, new estimators of the alpha-mu distribution are derived based on the skewness of the logarithmic alpha-mu distribution using the moments method. This distribution has been recently proposed to model the ...[+]
In this letter, new estimators of the alpha-mu distribution are derived based on the skewness of the logarithmic alpha-mu distribution using the moments method. This distribution has been recently proposed to model the received field strength in nonlinear propagation mediums. Therefore, simple and computationally efficient estimators are required to infer the parameters of the received signal amplitude distribution in nonlinear wireless communication propagation channels. The performance of these new estimators is compared to that obtained with the estimators calculated with the moments method of the alpha-mu distribution by solving numerically transcendental equations. These estimators are easily evaluated with simple expressions.
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Subjects:
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Estimation
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Fading channels
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Gamma distribution
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Land mobile radio propagation factors
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Probability
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Computationally efficient
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Fading distribution
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Field strengths
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Moments method
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Nonlinear propagation
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Propagation channels
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Received signals
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Simple expression
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Transcendental equations
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Wireless communications
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Fading (radio)
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Mobile radio systems
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Radio waves
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Wireless telecommunication systems
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Probability distributions
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Copyrigths:
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Reserva de todos los derechos
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Source:
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IEEE Transactions on Communications. (issn:
0090-6778
)
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DOI:
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10.1109/TCOMM.2011.080111.090223
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Publisher:
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Institute of Electrical and Electronics Engineers (IEEE)
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Publisher version:
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http://dx.doi.org/ 10.1109/TCOMM.2011.080111.090223
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Type:
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Artículo
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