Hii, Ding Hock; Muhammad, Nur Amalina; Muhammad, Noorhafiza(Universitat Politècnica de València, 2024-07-26)
[EN] The semiconductor industry faces the dual challenge of risk assessment and process improvement. This paper introduces a framework that integrates Failure Mode and Effects Analysis (FMEA) and Plan-Do-Check-Act (PDCA) ...