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Listar por autor "Miralaei, Negar"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por autor "Miralaei, Negar"

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    Enhancing the L1 Data Cache Design to Mitigate HCI 
    Valero Bresó, Alejandro; Miralaei, Negar; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio; Jones, Timothy M. (Institute of Electrical and Electronics Engineers (IEEE), 2016-07)
    [EN] Over the lifetime of a microprocessor, the Hot Carrier Injection (HCI) phenomenon degrades the threshold voltage, which causes slower transistor switching and eventually results in timing violations and faulty operation. ...
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    On Microarchitectural Mechanisms for Cache Wearout Reduction 
    Valero Bresó, Alejandro; Miralaei, Negar; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio; Jones, Timothy M. (Institute of Electrical and Electronics Engineers, 2017-03)
    [EN] Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleterious effects that increase a transistor's threshold voltage over the lifetime of a microprocessor. This voltage degradation ...