Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gracia-Morán, Joaquín; Baraza-Calvo, Juan-Carlos; Gil, Pedro(Institute of Electrical and Electronics Engineers, 2024)
[EN] MBU is an increasing challenge in SRAM memory, due to the chip's large area of SRAM, and supply power scaling applied to reduce static consumption. Powerful ECCs can cope with random MBUs, but at the expense of complex ...
Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Baraza-Calvo, Juan-Carlos; Gil Tomás, Daniel Antonio; Gil, Pedro(Institute of Electrical and Electronics Engineers, 2024-05)
[EN] With the integration scale level reached in CMOS technology, memory systems provide a great storage capacity, but at the price of an augment in their fault rate. In this way, the probability of experiencing Single ...
Andrés Martínez, David de; Ruiz García, Juan Carlos; Espinosa García, Jaime; Gil Vicente, Pedro Joaquín(2014)
The steady reduction of transistor size has brought embedded solutions into everyday life. However, the same features of deep-submicron technologies that are increasing the application spectrum of these solutions are also ...
Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2012-12)
Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which ...
Yerle Ballara, Carlos Martín(Universitat Politècnica de València, 2020-10-02)
[ES] Hoy en día el deporte forma parte de la vida cotidiana de gran parte la población, tanto sea de forma individual o realizando deportes de equipo, por eso el objetivo de este trabajo es diseñar e implementar una ...
Baraza Calvo, Juan Carlos(Universitat Politècnica de València, 2008-06-23)
En el diseño de sistemas informáticos (y en particular, de aquéllos en los que, por las características del servicio que prestan, un mal funcionamiento puede provocar pérdida de vidas humanas, perjuicio económico, suspensión ...
Blanc Clavero, Sara; Bonastre Pina, Alberto Miguel; Gil, Pedro(Elsevier, 2009)
This paper is focused on the validation by means of physical fault injection at pin-level of a time-triggered communication controller: the TTP/C versions C1 and C2. The controller is a commercial off-the-shelf product ...
Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Baraza-Calvo, Juan-Carlos; Gil Tomás, Daniel Antonio; Gil, Pedro(Institute of Electrical and Electronics Engineers, 2021-11)
[EN] The continuous raise in the integration scale of CMOS technology has provoked an augment in the fault rate. Particularly, computer memory is affected by Single Cell Upsets (SCU) and Multiple Cell Upsets (MCU). A common ...
Ripoll Ripoll, Ismael; Marco Gisbert, Héctor; Martínez Fernández, Victor; Gil, Pedro(Editorial Universitat Politècnica de València, 2018-09-26)
[EN] Technological advances affect to all fields of the society, which includes the methods used by some individuals cheat on exams. This work presents an effective detection system against the well known invisible earpiece ...
Campelo Rivadulla, José Carlos; Rodríguez-Ballester, Francisco; Rubio Moreno, Alicia; Ors Carot, Rafael; Gil, Pedro; Lemus Zúñiga, Lenin Guillermo; Busquets Mataix, José Vicente; Albaladejo Meroño, José; Serrano Martín, Juan José(Elsevier, 1999-09-03)
[EN] Nowadays, distributed architectures are the base of many manufacturing systems. Some aspects like fault-tolerance, system validation and design process are very important in the development of these systems. In this ...
Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)
With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Blanc Clavero, Sara; Gil Tomás, Daniel Antonio; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior ...
Saiz Adalid, Luis José(Universitat Politècnica de València, 2016-01-07)
[EN] From the first integrated circuit was developed to very large scale integration (VLSI) technology, the hardware of computer systems has had an immense evolution. Moore's Law, which predicts that the number of transistors ...
Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil, Pedro(MDPI AG, 2019-07-31)
[EN] Due to the increasing defect rates in highly scaled complementary metal-oxide-semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of growing importance. ...
Gracia-Morán, Joaquín; Ruiz García, Juan Carlos; Andrés Martínez, David de; Baraza Calvo, Juan Carlos; Gil Vicente, Pedro Joaquín(REFIEDU, 2014)
[EN] Nowadays, computer systems are present in almost all areas of life. However, it is very difficult to guarantee a determined Safety and Security level. Weak or incorrectly deployed Safety and Security policies may lead ...
Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil Tomás, Daniel Antonio; Gil, Pedro(Institute of Electrical and Electronics Engineers, 2018)
[EN] Currently, faults suffered by SRAM memory
systems have increased due to the aggressive CMOS integration
density. Thus, the probability of occurrence of single-cell
upsets (SCUs) or multiple-cell upsets (MCUs) ...
Espinosa García, Jaime; Andrés Martínez, David de; Gil, Pedro(IEEE Computer Society - Conference Publishing Services (CPS), 2015-09)
Technology advances provide a myriad of advantages
for VLSI systems, but also increase the sensitivity of the
combinational logic to different fault profiles. Shorter and shorter
faults which up to date had been filtered, ...
Gil Tomás, Daniel Antonio; Gracia Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz Adalid, Luis José; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2016-06)
As scaling is more and more aggressive, intermittent faults are increasing their importance in current deep submicron complementary metal-oxide-semiconductor (CMOS) technologies. This work shows the dependability assessment ...
Saiz-Adalid, Luis-J.; Reviriego, Pedro; Gil, Pedro; Pontarelli, Salvatore; Maestro, Juan Antonio(Institute of Electrical and Electronics Engineers (IEEE), 2015-10)
[EN] Static random access memories (SRAMs) are key in electronic systems. They are used not only as standalone devices, but also embedded in application specific integrated circuits. One key challenge for memories is their ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil Tomás, Daniel Antonio; Gil, Pedro(MDPI AG, 2020-12)
[EN] Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its ...