Andrés Martínez, David de; Ruiz García, Juan Carlos; Espinosa García, Jaime; Gil Vicente, Pedro Joaquín(2014)
The steady reduction of transistor size has brought embedded solutions into everyday life. However, the same features of deep-submicron technologies that are increasing the application spectrum of these solutions are also ...
Espinosa García, Jaime; Hernández Luz, Carles; Abella, Jaume; Andrés Martínez, David de; Ruiz García, Juan Carlos(ACM, 2015-06)
Increasingly complex microcontroller designs for safety-relevant
automotive systems require the adoption of new methods
and tools to enable a cost-effective verification of their
robustness. In particular, costs associated ...
Espinosa García, Jaime; Andrés Martínez, David de; Gil, Pedro(IEEE Computer Society - Conference Publishing Services (CPS), 2015-09)
Technology advances provide a myriad of advantages
for VLSI systems, but also increase the sensitivity of the
combinational logic to different fault profiles. Shorter and shorter
faults which up to date had been filtered, ...
Espinosa García, Jaime(Universitat Politècnica de València, 2016-11-03)
[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances ...
Laguna Cañizo, Ainhoa(Universitat Politècnica de València, 2023-10-05)
[ES] El objetivo del proyecto es crear un sistema de pruebas regresivas en el laboratorio para evaluar
las características de un circuito integrado. Para ello, se establecerán requisitos que el sistema
seguirá para ...
Espinosa García, Jaime; Andrés Martínez, David de; Ruiz, Juan Carlos; Gil, Pedro(Springer, 2013)
Current integration scales are increasing the number and types of faults that embedded systems must face. Traditional approaches focus on dealing with those transient and permanent faults that impact the state or output ...
Espinosa García, Jaime; Andrés Martínez, David de; Ruiz García, Juan Carlos; Hernández Luz, Carles; Abella, Jaume(IEEE Conference Publications, 2015-09)
Safety-critical applications are required today to meet
more and more stringent standards than ever. In the need of
reducing the costs associated with the certification step, early
robustness evaluation can provide ...