Casquel, R.; Soler, J. A.; Holgado, M.; Lopez, A.; Lavin, A.; de Vicente, J.; Sanza, F. J.; Laguna, M. F.; Holgado Bolaños, Miguel; Bañuls Polo, María-José; Puchades, Rosa(Optical Society of America, 2015-05-18)
In this work we present an optical technique for characterizing sub-micrometric areas based on reflectivity of the light as a function of angle of incidence for the two pure polarizations s and p, covering a range of angles ...