Cortés-Juan, F.; Chaverri Ramos, Christian; Connolly, James Patrick; David, Christin; García de Abajo, Francisco Javier; Hurtado Montañés, Juan; Mihailetchi, V.D.; Ponce-Alcántara, Salvador; Sánchez Plaza, Guillermo(American Institute of Physics, 2013)
[EN] The influence of the relative position of Ag metallic nanoparticles (Ag MNPs) embedded in a 100 nm SiOx Antireflection Coating (ARC) for specular polished c-Si substrates is studied. It is demonstrated that this ...