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Listar por palabra clave "Bias temperature instability (BTI)"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por palabra clave "Bias temperature instability (BTI)"

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    On Microarchitectural Mechanisms for Cache Wearout Reduction 
    Valero Bresó, Alejandro; Miralaei, Negar; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio; Jones, Timothy M. (Institute of Electrical and Electronics Engineers, 2017-03)
    [EN] Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleterious effects that increase a transistor's threshold voltage over the lifetime of a microprocessor. This voltage degradation ...