There is a great interest in dimensionality reduction techniques for tackling the problem of high-dimensional pattern classification. This paper addresses the topic of supervised learning of a linear dimension reduction ...
Reig, Juan; Rubio Arjona, Lorenzo(Institute of Electrical and Electronics Engineers (IEEE), 2011-12)
In this letter, new estimators of the alpha-mu distribution are derived based on the skewness of the logarithmic alpha-mu distribution using the moments method. This distribution has been recently proposed to model the ...