Campelo Rivadulla, José Carlos; Rodríguez-Ballester, Francisco; Rubio Moreno, Alicia; Ors Carot, Rafael; Gil, Pedro; Lemus Zúñiga, Lenin Guillermo; Busquets Mataix, José Vicente; Albaladejo Meroño, José; Serrano Martín, Juan José(Elsevier, 1999-09-03)
[EN] Nowadays, distributed architectures are the base of many manufacturing systems. Some aspects like fault-tolerance, system validation and design process are very important in the development of these systems. In this ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Blanc Clavero, Sara; Gil Tomás, Daniel Antonio; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior ...