- -

Listar por palabra clave "GALS"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por palabra clave "GALS"

Ordenar por:Orden:Resultados:

  • Icon
    On the impact of within-die process variation in GALS-Based NoC Performance 
    Hernández Luz, Carles; Roca Pérez, Antoni; Silla Jiménez, Federico; Flich Cardo, José; Duato Marín, José Francisco (Institute of Electrical and Electronics Engineers (IEEE), 2012-02)
    [EN] Current integration scales allow designing chip multiprocessors (CMP), where cores are interconnected by means of a network-on-chip (NoC). Unfortunately, the small feature size of current integration scales causes ...