Buscar en RiuNet

Listar

Todo RiuNet

Mi cuenta

Acceder

Ayuda RiuNet

Admin. UPV

Listar por palabra clave "Hardware description languages"

Mostrando ítems 1-5 de 5

Effects of intermittent faults on the reliability of a Reduced Instruction Set Computing (RISC) microprocessor

Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro (Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)

With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...
Enhancement of fault injection techniques based on the modification of VHDL code

Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Blanc Clavero, Sara; Gil Tomás, Daniel Antonio; Gil Vicente, Pedro Joaquín (Institute of Electrical and Electronics Engineers (IEEE), 2008)

Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior ...
Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System

Gil Tomás, Daniel Antonio; Gracia Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz Adalid, Luis José; Gil Vicente, Pedro Joaquín (Institute of Electrical and Electronics Engineers (IEEE), 2016-06)

As scaling is more and more aggressive, intermittent faults are increasing their importance in current deep submicron complementary metal-oxide-semiconductor (CMOS) technologies. This work shows the dependability assessment ...
Inyección de fallos basada en simuladores de código libre para sistemas modelados mediante lenguajes de descripción de hardware

Navarro López, Emilio (Universitat Politècnica de València, 2024-10-13)

[ES] La inyección de fallos es una metodología privilegiada para poder evaluar el comportamiento de un sistema en presencia de fallos, bien para estimar su robustez, detectar posibles cuellos de botella relacionados con ...
Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM

Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil Tomás, Daniel Antonio; Gil, Pedro (MDPI AG, 2020-12)

[EN] Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its ...