Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)
With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...
Herraiz, David; Esteban González, Héctor; Herraiz, Darío; de Dios, Juan J.; Fernández, Marcos D.; Belenguer, Ángel; Boria Esbert, Vicente Enrique(Institute of Electrical and Electronics Engineers, 2024)
[EN] High-directivity and low-loss directional couplers, based on Empty Substrate Integrated Coaxial Line (ESICL) technology, are presented in this article. The proposed coupled line direcional couplers, are based on ...