This paper presents a fault diagnosis application of the Latent Nestling Method to IGBTs. The paper extends the Latent Nestling Method based in Coloured Petri Nets (CPNs) to hybrid systems in such a manner that IGBTs ...
Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil, Pedro(MDPI AG, 2019-07-31)
[EN] Due to the increasing defect rates in highly scaled complementary metal-oxide-semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of growing importance. ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil Tomás, Daniel Antonio; Gil, Pedro(MDPI AG, 2020-12)
[EN] Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its ...