Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Baraza-Calvo, Juan-Carlos; Gil Tomás, Daniel Antonio; Gil, Pedro(Institute of Electrical and Electronics Engineers, 2024-05)
[EN] With the integration scale level reached in CMOS technology, memory systems provide a great storage capacity, but at the price of an augment in their fault rate. In this way, the probability of experiencing Single ...