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Listar por palabra clave "Nakagami-m fading"

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Analytical Approach to Model the Fade Depth and the Fade Margin in UWB Channels

Rubio Arjona, Lorenzo; Reig, Juan (Institute of Electrical and Electronics Engineers (IEEE), 2010-11)

In this letter, the variations of the ultra-wideband (UWB) channel power as a function of the channel bandwidth are investigated. An analytical approach to characterize the fade depth and the fade margin due to ...

Mostrando ítems 1-1 de 1