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Comparative Evaluation of Classification Methods Used in the Fault Diagnosis of Industrial Processes

Moreno, A.P.; SANTIAGO, O. L.; de Lázaro, J. M. B.; García Moreno, Emilio (Institute of Electrical and Electronics Engineers (IEEE), 2013)

This article presents a comparative study of the performance of classification techniques used for fault diagnosis in industrial processes. The techniques studied ranging from classifiers based on Bayes theory as Maximum ...

Mostrando ítems 1-1 de 1