Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz-Adalid, Luis-J.; Gil Vicente, Pedro Joaquín(Elsevier, 2012-11)
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and variety of fault types. Particularly, intermittent faults are expected to be an important issue in modern VLSI circuits. ...