Monerris Belda, Óscar; Díaz Caballero, Elena; Ruiz Garnica, Jesús; Boria Esbert, Vicente Enrique(Institute of Electrical and Electronics Engineers (IEEE), 2015-06)
When measuring RF or microwave devices under a temperature profile inside a climatic chamber, one of the main problems lies in the impossibility to have the network analyzer calibrated for all the temperatures measured ...