Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)
With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...