Fernández, Arturo J.; Pérez-González, Carlos J.; Carrión García, Andrés; Giner-Bosch, Vicent(Institute of Electrical and Electronics Engineers, 2023-09)
[EN] The impact of overdispersion on the design of optimal reliability demonstration test plans for beta-binomial models with Weibull, gamma, and lognormal lifetime distributions is analyzed. Assuming limited producer and ...