- -

Listar por palabra clave "Single cell upsets"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por palabra clave "Single cell upsets"

Ordenar por:Orden:Resultados:

  • thumb
    Design, Implementation and Evaluation of a Low Redundant Error Correction Code 
    Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Baraza-Calvo, Juan-Carlos; Gil Tomás, Daniel Antonio; Gil, Pedro (Institute of Electrical and Electronics Engineers, 2021-11)
    [EN] The continuous raise in the integration scale of CMOS technology has provoked an augment in the fault rate. Particularly, computer memory is affected by Single Cell Upsets (SCU) and Multiple Cell Upsets (MCU). A common ...