Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Blanc Clavero, Sara; Gil Tomás, Daniel Antonio; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior ...