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Listar por palabra clave "Cell flip peaks"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por palabra clave "Cell flip peaks"

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    Enhancing the L1 Data Cache Design to Mitigate HCI 
    Valero Bresó, Alejandro; Miralaei, Negar; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio; Jones, Timothy M. (Institute of Electrical and Electronics Engineers (IEEE), 2016-07)
    [EN] Over the lifetime of a microprocessor, the Hot Carrier Injection (HCI) phenomenon degrades the threshold voltage, which causes slower transistor switching and eventually results in timing violations and faulty operation. ...