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Listar por palabra clave "Fault tolerance, Multiple-cell upsets (MCUs)"

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Listar por palabra clave "Fault tolerance, Multiple-cell upsets (MCUs)"

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    Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications 
    Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil Tomás, Daniel Antonio; Gil, Pedro (Institute of Electrical and Electronics Engineers, 2018)
    [EN] Currently, faults suffered by SRAM memory systems have increased due to the aggressive CMOS integration density. Thus, the probability of occurrence of single-cell upsets (SCUs) or multiple-cell upsets (MCUs) ...