Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Gil Tomás, Daniel Antonio; Saiz-Adalid, Luis-J.; Gil, Pedro(Institute of Electrical and Electronics Engineers (IEEE), 2014-01-24)
With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Blanc Clavero, Sara; Gil Tomás, Daniel Antonio; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior ...
Gil Tomás, Daniel Antonio; Gracia Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz Adalid, Luis José; Gil Vicente, Pedro Joaquín(Institute of Electrical and Electronics Engineers (IEEE), 2016-06)
As scaling is more and more aggressive, intermittent faults are increasing their importance in current deep submicron complementary metal-oxide-semiconductor (CMOS) technologies. This work shows the dependability assessment ...
Baraza Calvo, Juan Carlos; Gracia-Morán, Joaquín; Saiz-Adalid, Luis-J.; Gil Tomás, Daniel Antonio; Gil, Pedro(MDPI AG, 2020-12)
[EN] Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its ...