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Listar por palabra clave "Reliability assessments"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por palabra clave "Reliability assessments"

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    Studying the effects of intermittent faults on a microcontroller 
    Gil Tomás, Daniel Antonio; Gracia-Morán, Joaquín; Baraza Calvo, Juan Carlos; Saiz-Adalid, Luis-J.; Gil Vicente, Pedro Joaquín (Elsevier, 2012-11)
    As CMOS technology scales to the nanometer range, designers have to deal with a growing number and variety of fault types. Particularly, intermittent faults are expected to be an important issue in modern VLSI circuits. ...