- -

Listar por palabra clave "Single error correction-double error detection (SEC-DED)"

RiuNet: Repositorio Institucional de la Universidad Politécnica de Valencia

Listar por palabra clave "Single error correction-double error detection (SEC-DED)"

Ordenar por:Orden:Resultados:

  • thumb
    MCU Tolerance in SRAMs through Low Redundancy Triple Adjacent Error Correction 
    Saiz-Adalid, Luis-J.; Reviriego, Pedro; Gil, Pedro; Pontarelli, Salvatore; Maestro, Juan Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2015-10)
    [EN] Static random access memories (SRAMs) are key in electronic systems. They are used not only as standalone devices, but also embedded in application specific integrated circuits. One key challenge for memories is their ...