Valero Bresó, Alejandro; Candel-Margaix, Francisco; Suárez-Gracia, Darío; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio(Institute of Electrical and Electronics Engineers, 2019-01-01)
[EN] Nowadays, GPUs sit at the forefront of high-performance computing thanks to their massive computational capabilities. Internally, thousands of functional units, architected to be fed by large register files, fuel such ...
Valero Bresó, Alejandro; Miralaei, Negar; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio; Jones, Timothy M.(Institute of Electrical and Electronics Engineers (IEEE), 2016-07)
[EN] Over the lifetime of a microprocessor, the Hot Carrier Injection (HCI) phenomenon degrades the threshold voltage, which causes slower transistor switching and eventually results in timing violations and faulty operation. ...
Valero Bresó, Alejandro; Miralaei, Negar; Petit Martí, Salvador Vicente; Sahuquillo Borrás, Julio; Jones, Timothy M.(Institute of Electrical and Electronics Engineers, 2017-03)
[EN] Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleterious effects that increase a transistor's threshold voltage over the lifetime of a microprocessor. This voltage degradation ...