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Thermal hysteresis of microwave loss in (La1-xPrx)(0.7)Ca 0.3MnO3 films

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Thermal hysteresis of microwave loss in (La1-xPrx)(0.7)Ca 0.3MnO3 films

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dc.contributor.author Kale, Sangeeta es_ES
dc.contributor.author Lofland, S.E. es_ES
dc.contributor.author Bhagat, S.M. es_ES
dc.contributor.author García Miquel, Ángel Héctor es_ES
dc.contributor.author Ogale, S.B. es_ES
dc.contributor.author Shinde, S.R. es_ES
dc.contributor.author Venkatesan, T. es_ES
dc.date.accessioned 2018-04-19T12:34:12Z
dc.date.available 2018-04-19T12:34:12Z
dc.date.issued 2002 es_ES
dc.identifier.issn 0021-8979 es_ES
dc.identifier.uri http://hdl.handle.net/10251/100671
dc.description.abstract [EN] We have measured the temperature (T) dependencies of the dc resistances (R-dc) and the microwave loss (R-muw) in a variety of samples of (La1-xPrx)(0.7)Ca0.3MnO3 while varying x from 0 to 0.4. Whereas both the sets of data exhibit maxima, the ac loss peak is much flatter and, during cooling, appears at a much lower temperature than the peak temperature in R-dc. The discrepancy, which vanishes for x=0, increases with lowering tolerance factor (t) (or increasing x). Also R-muw vs T exhibits large thermal hysteresis for x=0.4 indicating that the transition is first order. Cooling in a magnetic field of 9 kOe causes an upward shift of about 20 K in the R-muw peak, in some of the x=0.4 films, yielding a large magnetoimpedance. Further, once these films are exposed to a magnetic field at low T, they fail to recover their virginal behavior on subsequent cooling from room T. These films could be brought to their original state by annealing at high T. The discrepancy between R-dc and R-muw implies that the system is inhomogeneous at low T, providing, for the first time, microwave absorption evidence that manganites exhibit multiphase behavior. Presumably, disorder and strain (increasing with x) combine to stabilize a mixed phase. (C) 2002 American Institute of Physics. es_ES
dc.language Inglés es_ES
dc.publisher American Institute of Physics es_ES
dc.relation.ispartof Journal of Applied Physics es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject.classification TECNOLOGIA ELECTRONICA es_ES
dc.title Thermal hysteresis of microwave loss in (La1-xPrx)(0.7)Ca 0.3MnO3 films es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1063/1.1448308 es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion https://doi.org/10.1063/1.1448308 es_ES
dc.description.upvformatpinicio 7736 es_ES
dc.description.upvformatpfin 7738 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 91 es_ES
dc.description.issue 10 es_ES
dc.relation.pasarela S\22330 es_ES


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