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Bru-Orgiles, LA.; Pastor Abellán, D.; Muñoz, P. (2018). Integrated optical frequency domain reflectometry device for characterization of complex integrated devices. Optics Express. 26(23):30000-30008. https://doi.org/10.1364/OE.26.030000
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/121775
Título: | Integrated optical frequency domain reflectometry device for characterization of complex integrated devices | |
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[EN] Because of the demand for advanced measurement systems in the field of modern photonic integrated circuits, optical frequency domain reflectometry (OFDR) is a robust technique for characterizing design-to-fabrication ...[+]
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Derechos de uso: | Reconocimiento - No comercial (by-nc) | |
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Versión del editor: | https://doi.org/10.1364/OE.26.030000 | |
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