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Statistical moments of scintillation light distribution analysis with dSiPMs and monolithic crystals

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Statistical moments of scintillation light distribution analysis with dSiPMs and monolithic crystals

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dc.contributor.author Conde, P. es_ES
dc.contributor.author González Martínez, Antonio Javier es_ES
dc.contributor.author Hernández, L. es_ES
dc.contributor.author Bellido, P. es_ES
dc.contributor.author Crespo, E. es_ES
dc.contributor.author Iborra, A. es_ES
dc.contributor.author Moliner, L. es_ES
dc.contributor.author Rigla, J. P. es_ES
dc.contributor.author Rodríguez-Álvarez, M.J. es_ES
dc.contributor.author Sánchez, F. es_ES
dc.contributor.author Seimetz, Michael es_ES
dc.contributor.author Soriano, A. es_ES
dc.contributor.author Vidal San Sebastian, Luis Fernando es_ES
dc.contributor.author Benlloch Baviera, Jose María es_ES
dc.date.accessioned 2021-09-01T09:14:38Z
dc.date.available 2021-09-01T09:14:38Z
dc.date.issued 2013-11-02 es_ES
dc.identifier.isbn 978-1-4799-0534-8 es_ES
dc.identifier.uri http://hdl.handle.net/10251/171137
dc.description.abstract [EN] Monolithic scintillation crystals offer the possibility to preserve the scintillation light distribution, specially when black painted. Furthermore, the statistical moments of that distribution can provide accurate information about the three spatial components. Nevertheless, for monolithic crystal the moments estimation has an associated error due to the symmetry truncation of the light distribution towards the crystal borders. For the 2-D impact coordinates determination, this error is called compression as it is accentuated near the edges. The computation of all centered moments is, therefore, affected by this error. Digital SiPMs (dSiPMs) can offer complete information about the light distribution, since all cells are purely digital detectors, so that other ways to obtain ¿-impact coordinates can be performed. In this work, a comparison between the statistical moments analysis and an alternative fitting the light distribution for each event to a theoretical distribution has been made. With the fitted approach, compression is avoided and an approximately constant spatial resolution is obtained for the entire photodetection area. Moreover, DOI information is improved and preserved all over the crystal. es_ES
dc.description.sponsorship This work was supported by the Spanish Plan Nacional de Investigacion Científica, Desarrollo e Innovación Tecnologica (I+D+I) under Grant No. FIS2010-21216-CO2-01 and Valencian Local Government under Grants PROMETEOII/2013/010 and ISIC 2011/013 es_ES
dc.language Inglés es_ES
dc.publisher IEEE es_ES
dc.relation.ispartof 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject.classification MATEMATICA APLICADA es_ES
dc.title Statistical moments of scintillation light distribution analysis with dSiPMs and monolithic crystals es_ES
dc.type Comunicación en congreso es_ES
dc.type Capítulo de libro es_ES
dc.identifier.doi 10.1109/NSSMIC.2013.6829086 es_ES
dc.relation.projectID info:eu-repo/grantAgreement/GVA//ISIC%2F2011%2F013/ es_ES
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//FIS2010-21216-C02-01/ES/DESARROLLO DEL DETECTOR PET%2FRM PARA DIAGNOSTICO DE ENFERMEDADES NEURODEGENERATIVAS./ es_ES
dc.relation.projectID info:eu-repo/grantAgreement/GVA//PROMETEOII%2F2013%2F010/ es_ES
dc.rights.accessRights Abierto es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto de Instrumentación para Imagen Molecular - Institut d'Instrumentació per a Imatge Molecular es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Matemática Aplicada - Departament de Matemàtica Aplicada es_ES
dc.description.bibliographicCitation Conde, P.; González Martínez, AJ.; Hernández, L.; Bellido, P.; Crespo, E.; Iborra, A.; Moliner, L.... (2013). Statistical moments of scintillation light distribution analysis with dSiPMs and monolithic crystals. IEEE. 10-13. https://doi.org/10.1109/NSSMIC.2013.6829086 es_ES
dc.description.accrualMethod S es_ES
dc.relation.conferencename IEEE Nuclear Science Symposium and Medical Imaging Conference, and Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors Workshop (2013 IEEE NSS/MIC/RTSD) es_ES
dc.relation.conferencedate Octubre 27-Noviembre 02,2013 es_ES
dc.relation.conferenceplace Seoul, Korea es_ES
dc.relation.publisherversion https://doi.org/10.1109/NSSMIC.2013.6829086 es_ES
dc.description.upvformatpinicio 10 es_ES
dc.description.upvformatpfin 13 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.relation.pasarela S\268518 es_ES
dc.contributor.funder Generalitat Valenciana es_ES
dc.contributor.funder Ministerio de Ciencia e Innovación es_ES


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