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Non-Geminate Recombination as the Primary Determinant of Open-Circuit Voltage in Polythiophene:Fullerene Blend Solar Cells: an Analysis of the Influence of Device Processing Conditions

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Non-Geminate Recombination as the Primary Determinant of Open-Circuit Voltage in Polythiophene:Fullerene Blend Solar Cells: an Analysis of the Influence of Device Processing Conditions

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dc.contributor.author Credgington, Dan es_ES
dc.contributor.author Hamilton, Rick es_ES
dc.contributor.author Atienzar Corvillo, Pedro Enrique es_ES
dc.contributor.author Nelson, Jenny es_ES
dc.contributor.author Durrant, James R. es_ES
dc.date.accessioned 2013-05-22T12:07:30Z
dc.date.issued 2011
dc.identifier.issn 1616-301X
dc.identifier.uri http://hdl.handle.net/10251/29045
dc.description.abstract [EN] The physical origin of the open-circuit voltage in bulk heterojunction solar cells is still not well understood. While signi¿ cant evidence exists to indicate that the open-circuit voltage is limited by the molecular orbital energies of the heterojunction components, it is clear that this picture is not suf¿ cient to explain the signi¿ cant variations which often occur between cells fabricated from the same heterojunction components. We present here an analysis of the variation in open-circuit voltage between 0.4¿0.65 V observed for a range of P3HT/PCBM solar cells where device deposition conditions, electrode structure, active-layer thickness and device polarity are varied. The analysis quanti¿ es non-geminate recombination losses of dissociated carriers in these cells, measured under device operating conditions. It is found that at opencircuit, losses due to non-geminate recombination are suf¿ ciently large that other loss pathways may effectively be neglected. Variations in open-circuit voltage between different devices are shown to arise from differences in the rate coef¿ cient for non-geminate recombination, and from differences in the charge densities in the photoactive layer of the device. The origin of these differences is discussed, particularly with regard to variations in ¿ lm microstructure. By separately quantifying these differences in rate coef¿ cient and charge density, and by application of a simple physical model based upon the assumption that open-circuit is reached when the ¿ ux of charge photogeneration is matched by the ¿ ux of non-geminate recombination, we are able to calculate correctly the open-circuit voltage for all the cells studied to within an accuracy of ± 5 mV. es_ES
dc.description.sponsorship We would like to thank Chris Shuttle, Andrea Maurano and Thomas Kirchartz for helpful discussions during the preparation of this publication. We gratefully acknowledge financial support from the EPSRC Supergen, Nanotechnology Grand Challenge and Apex projects.
dc.language Inglés es_ES
dc.relation.ispartof Advanced Functional Materials es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Solar cell es_ES
dc.subject Electrodes es_ES
dc.subject Organic electronics es_ES
dc.subject Recombination es_ES
dc.subject Open circuit voltage es_ES
dc.subject Photovoltaic devices es_ES
dc.subject Conversion efficiency es_ES
dc.subject.classification QUIMICA ANALITICA es_ES
dc.title Non-Geminate Recombination as the Primary Determinant of Open-Circuit Voltage in Polythiophene:Fullerene Blend Solar Cells: an Analysis of the Influence of Device Processing Conditions es_ES
dc.type Artículo es_ES
dc.embargo.lift 10000-01-01
dc.embargo.terms forever es_ES
dc.identifier.doi 10.1002/adfm.201100225
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto Universitario Mixto de Tecnología Química - Institut Universitari Mixt de Tecnologia Química es_ES
dc.description.bibliographicCitation Credgington, D.; Hamilton, R.; Atienzar Corvillo, PE.; Nelson, J.; Durrant, JR. (2011). Non-Geminate Recombination as the Primary Determinant of Open-Circuit Voltage in Polythiophene:Fullerene Blend Solar Cells: an Analysis of the Influence of Device Processing Conditions. Advanced Functional Materials. 21(14):2744-2753. doi:10.1002/adfm.201100225 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1002/adfm.201100225 es_ES
dc.description.upvformatpinicio 2744 es_ES
dc.description.upvformatpfin 2753 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 21 es_ES
dc.description.issue 14 es_ES
dc.relation.senia 217582
dc.contributor.funder Engineering and Physical Sciences Research Council, Reino Unido


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