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Experimental procurement of the complete 3D etch rate distribution of Si in anisotropic etchants based on vertically micromachined wagon wheel samples

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Experimental procurement of the complete 3D etch rate distribution of Si in anisotropic etchants based on vertically micromachined wagon wheel samples

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dc.contributor.author Gosalvez Ayuso, Miguel Angel es_ES
dc.contributor.author Pal, Prem es_ES
dc.contributor.author Ferrando Jódar, Néstor es_ES
dc.contributor.author Hida, Hirotaka es_ES
dc.contributor.author Sato, Kazuo es_ES
dc.date.accessioned 2017-01-11T15:59:12Z
dc.date.available 2017-01-11T15:59:12Z
dc.date.issued 2011-12
dc.identifier.issn 0960-1317
dc.identifier.uri http://hdl.handle.net/10251/76646
dc.description.abstract This is part I of a series of two papers dedicated to the presentation of a novel, large throughput, experimental procedure to determine the three-dimensional distribution of the etch rate of silicon in a wide range of anisotropic etchants, including a total of 30 different etching conditions in KOH, KOH+IPA, TMAH and TMAH+Triton solutions at various concentrations and temperatures. The method is based on the use of previously reported, vertically micromachined wagon wheels (WWs) (Wind and Hines 2000 Surf. Sci. 460 21-38; Nguyen and Elwenspoek 2007 J. Electrochem. Soc. 154 D684-91), focusing on speeding up the etch rate extraction process for each WW by combining macrophotography and image processing procedures. The proposed procedure positions the WWs as a realistic alternative to the traditional hemispherical specimen. The obtained, extensive etch rate database is used to perform wet etching simulations of advanced systems, showing good agreement with the experimental counterparts. In part II of this series (Gosalvez et al J. Micromech. Microeng. 21 125008), we provide a theoretical analysis of the etched spoke shapes, a detailed comparison to the etch rates from previous studies and a self-consistency study of the measured etch rates against maximum theoretical values derived from the spoke shape analysis. es_ES
dc.description.sponsorship We are greatly thankful to Dr M Tilli, Okmetic Oy, Finland, for generously donating the {1 1 0} wafers used in the experiments. We also thank Mr S Senda of the Technology Center, Nagoya University, for helpful discussions regarding the design of the sample holder and its fabrication, Dr B Tang, Department of Micro-Nano Systems Eng., Nagoya University, for performing a couple of experiments, and Dr J Ohara, Denso Corp., Japan, for useful discussions. We acknowledge support by the Ramon y Cajal Fellowship Program by the Spanish Ministry of Science and Innovation, Spanish CICYT FIS2010-21216-C02-02 grant, MEXT Grant in Aid Research (Kakenhi: (A) 19201026), JSPS Postdoctoral Fellowship program of Japan and the Global COE program of Japan (GCOE, Wakate JSPS Young Scientist Fund). en_EN
dc.language Inglés es_ES
dc.publisher IOP Publishing es_ES
dc.relation.ispartof Journal of Micromechanics and Microengineering es_ES
dc.rights Reserva de todos los derechos es_ES
dc.title Experimental procurement of the complete 3D etch rate distribution of Si in anisotropic etchants based on vertically micromachined wagon wheel samples es_ES
dc.type Artículo es_ES
dc.identifier.doi 10.1088/0960-1317/21/12/125007
dc.relation.projectID info:eu-repo/grantAgreement/MICINN//FIS2010-21216-C02-02/ES/DESARROLLO DE LA ELECTRONICA PARA DIAGNOSTICO DE ENFERMEDADES NEURODEGENERATIVAS./ es_ES
dc.relation.projectID info:eu-repo/grantAgreement/MEXT//19201026/ es_ES
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Instituto de Instrumentación para Imagen Molecular - Institut d'Instrumentació per a Imatge Molecular es_ES
dc.description.bibliographicCitation Gosalvez Ayuso, MA.; Pal, P.; Ferrando Jódar, N.; Hida, H.; Sato, K. (2011). Experimental procurement of the complete 3D etch rate distribution of Si in anisotropic etchants based on vertically micromachined wagon wheel samples. Journal of Micromechanics and Microengineering. 21(12):1-14. https://doi.org/10.1088/0960-1317/21/12/125007 es_ES
dc.description.accrualMethod S es_ES
dc.relation.publisherversion http://dx.doi.org/10.1088/0960-1317/21/12/125007 es_ES
dc.description.upvformatpinicio 1 es_ES
dc.description.upvformatpfin 14 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion es_ES
dc.description.volume 21 es_ES
dc.description.issue 12 es_ES
dc.relation.senia 206241 es_ES
dc.contributor.funder Ministerio de Ciencia e Innovación es_ES
dc.contributor.funder Ministry of Education, Culture, Sports, Science and Technology, Japón es_ES
dc.contributor.funder Japan Society for the Promotion of Science es_ES


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