Nucleation modelling on ZnO electrodeposition

Abstract

[EN] Short ZnO nanorods have been produced on ITO covered glass substrates by pulsed electrodeposition. The role of reactants and droplet interfaces on the nucleation and growth of ZnO nanorods have been investigated. A conceptual model for nucleation of ZnO nanorods has been proposed by describing the half-oxidation and reduction reactions at the growth front. The importance of limit layer [OH-] on the nucleation phenomena has been studied by assesing difussion through the finite differences electrochemical model. Atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and electrochemical quartz crystal microbalance (EQCM) analysis have been used to characterize ZnO nanorods and investigate the nucleation model.