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Inexpensive Measuring System for the Characterization of Organic Transistors

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Inexpensive Measuring System for the Characterization of Organic Transistors

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Pérez Fuster, C.; Lidon-Roger, JV.; Contat-Rodrigo, L.; Garcia-Breijo, E. (2018). Inexpensive Measuring System for the Characterization of Organic Transistors. Journal of Sensors. 2018:1-9. https://doi.org/10.1155/2018/4286894

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/117013

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Title: Inexpensive Measuring System for the Characterization of Organic Transistors
Author: Pérez Fuster, Clara Lidon-Roger, Jose V. Contat-Rodrigo, L Garcia-Breijo, Eduardo
UPV Unit: Universitat Politècnica de València. Departamento de Máquinas y Motores Térmicos - Departament de Màquines i Motors Tèrmics
Universitat Politècnica de València. Departamento de Ingeniería Electrónica - Departament d'Enginyeria Electrònica
Issued date:
Abstract:
[EN] A measuring module has been specifically designed for the electrical characterization of organic semiconductor devices such as organic field effect transistors (OFETs) and organic electrochemical transistors (OECTs) ...[+]
Subjects: Organic transistors , OFETs , Measuring System
Copyrigths: Reconocimiento (by)
Source:
Journal of Sensors. (issn: 1687-725X )
DOI: 10.1155/2018/4286894
Publisher:
Hindawi Limited
Publisher version: https://doi.org/10.1155/2018/4286894
Project ID:
GV/AICO/2015/103
Thanks:
All financial support from the Spanish Government and FEDER funds (MAT2015-64139-C4-3-R (MINECO/FEDER)) and the Generalitat Valenciana (GVA funds) (AICO/2015/103) is gratefully acknowledged.
Type: Artículo

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