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Full-Wave Modal Analysis of a Novel Dielectrometer for Accurate Measurement of Complex Permittivity of High-Loss Liquids at Microwave Frequencies

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Full-Wave Modal Analysis of a Novel Dielectrometer for Accurate Measurement of Complex Permittivity of High-Loss Liquids at Microwave Frequencies

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Marqués-Villarroya, D.; Canós Marín, AJ.; Penaranda-Foix, FL.; García-Baños, B.; Catalá Civera, JM. (2018). Full-Wave Modal Analysis of a Novel Dielectrometer for Accurate Measurement of Complex Permittivity of High-Loss Liquids at Microwave Frequencies. IEEE Transactions on Microwave Theory and Techniques. 66(12):5760-5770. https://doi.org/10.1109/TMTT.2018.2881136

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/121351

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Título: Full-Wave Modal Analysis of a Novel Dielectrometer for Accurate Measurement of Complex Permittivity of High-Loss Liquids at Microwave Frequencies
Autor: Marqués-Villarroya, David Canós Marín, Antoni Josep Penaranda-Foix, Felipe L. García-Baños, Beatriz Catalá Civera, José Manuel
Entidad UPV: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Fecha difusión:
Resumen:
[EN] A novel dielectrometer to measure the complex permittivity of high-loss liquids is presented. The geometry consists of a reentrant cavity with insertion holes, where the holder filled with liquid can be introduced ...[+]
Palabras clave: Full-wave modeling , High-loss liquids , Mode-matching , Permittivity , Reentrant cavity
Derechos de uso: Reserva de todos los derechos
Fuente:
IEEE Transactions on Microwave Theory and Techniques. (issn: 0018-9480 )
DOI: 10.1109/TMTT.2018.2881136
Editorial:
Institute of Electrical and Electronics Engineers
Versión del editor: http://doi.org/ 10.1109/TMTT.2018.2881136
Código del Proyecto:
info:eu-repo/grantAgreement/MINECO//TEC2012-37532-C02-01/ES/DISPOSITIVOS DE DIELECTROMETRIA DINAMICA DE MICROONDAS DE POTENCIA PARA SINTERIZADO DE MATERIALES DE ALTO RENDIMIENTO/
Descripción: © 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Agradecimientos:
This work was supported in part by the "Programa de Ayudas de Investigacion y Desarrollo de la Universitat Politecnica de Valencia," in part by the Ministerio de Economia y Competitividad-Spanish Government under Project ...[+]
Tipo: Artículo

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