Characterisation of on-chip wireless interconnects based on silicon nanoantennas via near-field scanning optical microscopy

Abstract

[EN] Recently, a novel Photonic-Integrated Circuit (PIC) paradigm based on the use of a new kind of ultra-directive, lowloss, highly efficient and broadband silicon nanoantenna has enabled the first demonstration of an on-chip wireless interconnect, with potential applications in reconfigurable networks and lab-on-a-chip systems. Despite the fact that the far-field properties of these nanoantennas have been widely studied, their near-field behaviour stays unexplored. Here, the authors study this feature through scanning near-field optical microscopy (SNOM). For this purpose, the authors design and characterise an on-chip twoport wireless link using a tailored SNOM. The conducted near-field measurements will be useful to improve the design of these integrated photonic devices with potential impact on a variety of applications, from biosensing to optical communications.