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Ghosh, S.; Haefner, J.; Martín-Albo, J.; Guenette, R.; Li, X.; Loya Villalpando, A.; Burch, C.... (2020). Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air. Journal of Instrumentation. 15(11):1-17. https://doi.org/10.1088/1748-0221/15/11/P11031
Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/172317
Título: | Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air | |
Autor: | Ghosh, S. Haefner, J. Martín-Albo, J. Guenette, R. Li, X. Loya Villalpando, A.A. Burch, C. Adams, C. Arazi, L. Arnquist, I.J. Azevedo, C.D.R. Bailey, K. Benlloch-Rodríguez, J.M. Rodriguez-Samaniego, Javier | |
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[EN] Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, ...[+]
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Derechos de uso: | Reserva de todos los derechos | |
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Versión del editor: | https://doi.org/10.1088/1748-0221/15/11/P11031 | |
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The NEXT Collaboration acknowledges support from the following agencies and institutions: the European Research Council (ERC) under the Advanced Grant 339787-NEXT; the European Union's Framework Programme for Research and ...[+]
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