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dc.contributor.author | Fernández, Arturo J.![]() |
es_ES |
dc.contributor.author | Pérez-González, Carlos J.![]() |
es_ES |
dc.contributor.author | Carrión García, Andrés![]() |
es_ES |
dc.contributor.author | Giner-Bosch, Vicent![]() |
es_ES |
dc.date.accessioned | 2023-11-22T19:02:29Z | |
dc.date.available | 2023-11-22T19:02:29Z | |
dc.date.issued | 2023-09 | es_ES |
dc.identifier.issn | 0018-9529 | es_ES |
dc.identifier.uri | http://hdl.handle.net/10251/200127 | |
dc.description | © 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | es_ES |
dc.description.abstract | [EN] The impact of overdispersion on the design of optimal reliability demonstration test plans for beta-binomial models with Weibull, gamma, and lognormal lifetime distributions is analyzed. Assuming limited producer and consumer risks, fixed-duration test plans with minimal sample sizes and optimal-duration test plans with minimum costs based on failure count data are determined by solving the corresponding nonlinear programming problems when the fluctuation of the failure probability is described by a beta distribution. If the test time is fixed, the overdispersion effect on the optimal sample size and decision criterion is important in most situations. The influence is less relevant when the engineer also wants to find the minimum-cost test time. Optimal-duration plans usually outperform fixed-duration schemes in terms of costs and robustness against overdispersion. The use of lot inspection schemes with optimal reliability test times is strongly recommended when the presence of overdispersed failure count data is suspected. Applications of the developed methodology to the manufacturing of microelectronic chips and semiconductor lasers are provided for illustrative and comparative purposes. | es_ES |
dc.description.sponsorship | This work was supported in part by MCIN/AEI/10.13039/501100011033 under Grant PID2019-110442GB-I00. Associate Editor: Mohammad Zulkernine. | es_ES |
dc.language | Inglés | es_ES |
dc.publisher | Institute of Electrical and Electronics Engineers | es_ES |
dc.relation.ispartof | IEEE Transactions on Reliability | es_ES |
dc.rights | Reserva de todos los derechos | es_ES |
dc.subject | Reliability | es_ES |
dc.subject | Reliability engineering | es_ES |
dc.subject | Inspection | es_ES |
dc.subject | Shape | es_ES |
dc.subject | Dispersion | es_ES |
dc.subject | Programming | es_ES |
dc.subject | Cost function | es_ES |
dc.subject.classification | ESTADISTICA E INVESTIGACION OPERATIVA | es_ES |
dc.title | Overdispersion Effects on Reliability Test Planning | es_ES |
dc.type | Artículo | es_ES |
dc.identifier.doi | 10.1109/TR.2022.3195055 | es_ES |
dc.relation.projectID | info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-110442GB-I00/ES/INFERENCIA ESTADISTICA Y MODELIZACION APLICADA AL CONTROL DE CALIDAD, LA MONITORIZACION DE PROCESOS Y EL ANALISIS DE FIABILIDAD INDUSTRIAL/ | es_ES |
dc.rights.accessRights | Abierto | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Facultad de Administración y Dirección de Empresas - Facultat d'Administració i Direcció d'Empreses | es_ES |
dc.contributor.affiliation | Universitat Politècnica de València. Escuela Técnica Superior de Ingenieros Industriales - Escola Tècnica Superior d'Enginyers Industrials | es_ES |
dc.description.bibliographicCitation | Fernández, AJ.; Pérez-González, CJ.; Carrión García, A.; Giner-Bosch, V. (2023). Overdispersion Effects on Reliability Test Planning. IEEE Transactions on Reliability. 72(3):1053-1063. https://doi.org/10.1109/TR.2022.3195055 | es_ES |
dc.description.accrualMethod | S | es_ES |
dc.relation.publisherversion | https://doi.org/10.1109/TR.2022.3195055 | es_ES |
dc.description.upvformatpinicio | 1053 | es_ES |
dc.description.upvformatpfin | 1063 | es_ES |
dc.type.version | info:eu-repo/semantics/publishedVersion | es_ES |
dc.description.volume | 72 | es_ES |
dc.description.issue | 3 | es_ES |
dc.relation.pasarela | S\470262 | es_ES |
dc.contributor.funder | Ministerio de Ciencia e Innovación | es_ES |