New methodology for temperature and emissivity estimation by the use of infrared thermography

Abstract

[EN] A new method for the estimation of both parameters: surface temperature and emissivity is proposed and explained in this paper. It is for its application on surfaces and materials with specular reflection, which in fact is more common in the infrared spectrum than in the visual range. The use of the method does not need any type of contact with the surface, or the application of special coatings or putting electrical tapes, it is only necessary a usual calibrated infrared camera. Some examples of the use of the new method are shown at the paper, and promising new developments are described.