- -

Accurate calibration with highly distorted images

RiuNet: Institutional repository of the Polithecnic University of Valencia

Share/Send to

Cited by

Statistics

Accurate calibration with highly distorted images

Show simple item record

Files in this item

dc.contributor.author Ricolfe Viala, Carlos es_ES
dc.contributor.author Sánchez Salmerón, Antonio José es_ES
dc.contributor.author Martínez Bertí, Enrique es_ES
dc.date.accessioned 2013-04-15T10:49:09Z
dc.date.available 2013-04-15T10:49:09Z
dc.date.issued 2012
dc.identifier.issn 0003-6935
dc.identifier.uri http://hdl.handle.net/10251/27831
dc.description This paper was published in APPLIED OPTICS and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/viewmedia.cfm?uri=ao-51-1-89&seq=0. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law en_EN
dc.description.abstract Camera calibration is a two-step process where first a linear algebraic approximation is followed by a nonlinear minimization. The nonlinear minimization adjusts the pin-hole and lens distortion models to the calibrating data. Since both models are coupled, nonlinear minimization can converge to a local solution easily. Moreover, nonlinear minimization is poorly conditioned since parameters with different effects in the minimization function are calculated simultaneously (some are in pixels, some in world coordinates, and some are lens distortion parameters). A local solution is adapted to parameters, which minimize the function easily, and the remaining parameters are just adapted to this solution.We propose a calibration method where traditional calibration steps are inverted. First, a nonlinear minimization is done, and after, camera parameters are computed in a linear step. Using projective geometry constraints in a nonlinear minimization process, detected point locations in the images are corrected. The pin-hole and lens distortion models are computed separately with corrected point locations. The proposed method avoids the coupling between both models. Also, the condition of nonlinear minimization increases since points coordinates are computed alone. © 2011 Optical Society of America. es_ES
dc.language Inglés es_ES
dc.publisher Optical Society of America
dc.relation.ispartof Applied Optics es_ES
dc.rights Reserva de todos los derechos es_ES
dc.subject Calibration method es_ES
dc.subject Camera calibration es_ES
dc.subject Camera parameter es_ES
dc.subject Different effects es_ES
dc.subject Distorted images es_ES
dc.subject Lens distortion es_ES
dc.subject Lens distortion parameters es_ES
dc.subject Linear-algebraic es_ES
dc.subject Local solution es_ES
dc.subject Minimization function es_ES
dc.subject Nonlinear minimization es_ES
dc.subject Point location es_ES
dc.subject Projective geometry es_ES
dc.subject Traditional calibration es_ES
dc.subject Two-step process es_ES
dc.subject World coordinates es_ES
dc.subject Cameras es_ES
dc.subject Calibration es_ES
dc.subject.classification INGENIERIA DE SISTEMAS Y AUTOMATICA es_ES
dc.title Accurate calibration with highly distorted images es_ES
dc.type Artículo es_ES
dc.rights.accessRights Cerrado es_ES
dc.contributor.affiliation Universitat Politècnica de València. Departamento de Ingeniería de Sistemas y Automática - Departament d'Enginyeria de Sistemes i Automàtica es_ES
dc.description.bibliographicCitation Ricolfe Viala, C.; Sánchez Salmerón, AJ.; Martínez Berti, E. (2012). Accurate calibration with highly distorted images. Applied Optics. 51(1):89-101. http://hdl.handle.net/10251/27831 es_ES
dc.description.accrualMethod Senia es_ES
dc.relation.publisherversion http://www.opticsinfobase.org/ao/viewmedia.cfm?uri=ao-51-1-89&seq=0 es_ES
dc.description.upvformatpinicio 89 es_ES
dc.description.upvformatpfin 101 es_ES
dc.type.version info:eu repo/semantics/publishedVersion es_ES
dc.description.volume 51 es_ES
dc.description.issue 1 es_ES
dc.relation.senia 208975


This item appears in the following Collection(s)

Show simple item record