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Studying the effects of intermittent faults on a microcontroller

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Studying the effects of intermittent faults on a microcontroller

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Gil Tomás, DA.; Gracia-Morán, J.; Baraza Calvo, JC.; Saiz-Adalid, L.; Gil Vicente, PJ. (2012). Studying the effects of intermittent faults on a microcontroller. Microelectronics Reliability. 52(11):2837-2846. doi:10.1016/j.microrel.2012.06.004

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/36000

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Title: Studying the effects of intermittent faults on a microcontroller
Author: Gil Tomás, Daniel Antonio Gracia-Morán, Joaquín Baraza Calvo, Juan Carlos Saiz-Adalid, Luis-J. Gil Vicente, Pedro Joaquín
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Issued date:
Abstract:
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and variety of fault types. Particularly, intermittent faults are expected to be an important issue in modern VLSI circuits. ...[+]
Subjects: Abstraction level , Aging mechanism , CMOS technology , Fault Injection techniques , Fault types , Intermittent fault , Manufacturing process , Nano meter range , Parameter variation , Register transfer , Reliability assessments , Risc microprocessors
Copyrigths: Reserva de todos los derechos
Source:
Microelectronics Reliability. (issn: 0026-2714 )
DOI: 10.1016/j.microrel.2012.06.004
Publisher:
Elsevier
Publisher version: http://dx.doi.org/10.1016/j.microrel.2012.06.004
Thanks:
This work has been funded by the Spanish Government under the Research Project TIN2009-13825.
Type: Artículo

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