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A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs

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A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs

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Ghiribaldi, A.; Ludovici, D.; Triviño, F.; Strano, A.; Flich Cardo, J.; Sánchez García, JL.; Alfaro, F.... (2013). A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs. ACM Transactions in Embedded Computing Systems. 12(4):106:1-106:29. doi:10.1145/2485984.2485994

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/39673

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Title: A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs
Author:
UPV Unit: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors
Issued date:
Abstract:
[EN] Networks-on-chip need to survive to manufacturing faults in order to sustain yield. An effective testing and configuration strategy however implies two opposite requirements. One one hand, a fast and scalable ...[+]
Subjects: Design , Algorithms , Reliability , Network-on-Chip , Fault Tolerance , Testing
Copyrigths: Cerrado
Source:
ACM Transactions in Embedded Computing Systems. (issn: 1539-9087 )
DOI: 10.1145/2485984.2485994
Publisher:
Association for Computing Machinery (ACM)
Publisher version: http://dx.doi.org/10.1145/2485984.2485994
Project ID: info:eu-repo/grantAgreement/EC/FP7/248972
Description: © ACM, 2013. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in PUBLICATION, ACM Transactions on Embedded Computing Systems, Vol. 12, No. 4, Article 106, Publication date: June 2013.http://doi.acm.org/10.1145/2485984.2485994
Thanks:
This work was supported by the NANOC European Project (FPT7-ICT-248972) and by the HiPEAC Network of Excellence (Interconnect Cluster).
Type: Artículo

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