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Birefringence measurement in the THz range based on double Fourier analysis

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Birefringence measurement in the THz range based on double Fourier analysis

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Sanjuan, F.; Bockelt, AS.; Vidal Rodriguez, B. (2014). Birefringence measurement in the THz range based on double Fourier analysis. Optics Letters. 39(4):809-812. https://doi.org/10.1364/OL.39.000809

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Título: Birefringence measurement in the THz range based on double Fourier analysis
Autor: Sanjuan, Federico Bockelt, Alexander Stefan Vidal Rodriguez, Borja
Entidad UPV: Universitat Politècnica de València. Instituto Universitario de Tecnología Nanofotónica - Institut Universitari de Tecnologia Nanofotònica
Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Fecha difusión:
Resumen:
A method for obtaining the average refractive indexes of a birefringent material in the terahertz region in a single measurement with a standard terahertz time-domain spectrometer is presented. The method is based on ...[+]
Palabras clave: TIME-DOMAIN SPECTROSCOPY , ORIENTATION
Derechos de uso: Reserva de todos los derechos
Fuente:
Optics Letters. (issn: 0146-9592 )
DOI: 10.1364/OL.39.000809
Editorial:
Optical Society of America
Versión del editor: http://dx.doi.org/10.1364/OL.39.000809
Código del Proyecto:
info:eu-repo/grantAgreement/MINECO//TEC2012-35797/ES/ESPECTROSCOPIA DE TERAHERCIOS EN FIBRA OPTICA PARA APLICACIONES DE SENSADO DE MATERIALES/
Descripción: This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OL.39.000809. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law"
Agradecimientos:
The authors thank the Erasmus Mundus scholarship and the Consejo Nacional de Investigaciones Cientificas y Tecnicas (Conicet) that support the work of Federico Sanjuan at Universitat Politecnica de Valencia and the Spanish ...[+]
Tipo: Artículo

References

Wiesauer, K., & Jördens, C. (2013). Recent Advances in Birefringence Studies at THz Frequencies. Journal of Infrared, Millimeter, and Terahertz Waves, 34(11), 663-681. doi:10.1007/s10762-013-9976-4

Jördens, C., Scheller, M., Wietzke, S., Romeike, D., Jansen, C., Zentgraf, T., … Koch, M. (2010). Terahertz spectroscopy to study the orientation of glass fibres in reinforced plastics. Composites Science and Technology, 70(3), 472-477. doi:10.1016/j.compscitech.2009.11.022

Jördens, C., Scheller, M., Wichmann, M., Mikulics, M., Wiesauer, K., & Koch, M. (2009). Terahertz birefringence for orientation analysis. Applied Optics, 48(11), 2037. doi:10.1364/ao.48.002037 [+]
Wiesauer, K., & Jördens, C. (2013). Recent Advances in Birefringence Studies at THz Frequencies. Journal of Infrared, Millimeter, and Terahertz Waves, 34(11), 663-681. doi:10.1007/s10762-013-9976-4

Jördens, C., Scheller, M., Wietzke, S., Romeike, D., Jansen, C., Zentgraf, T., … Koch, M. (2010). Terahertz spectroscopy to study the orientation of glass fibres in reinforced plastics. Composites Science and Technology, 70(3), 472-477. doi:10.1016/j.compscitech.2009.11.022

Jördens, C., Scheller, M., Wichmann, M., Mikulics, M., Wiesauer, K., & Koch, M. (2009). Terahertz birefringence for orientation analysis. Applied Optics, 48(11), 2037. doi:10.1364/ao.48.002037

Kim, Y., Yi, M., Kim, B. G., & Ahn, J. (2011). Investigation of THz birefringence measurement and calculation in Al_2O_3 and LiNbO_3. Applied Optics, 50(18), 2906. doi:10.1364/ao.50.002906

Reid, M., & Fedosejevs, R. (2006). Terahertz birefringence and attenuation properties of wood and paper. Applied Optics, 45(12), 2766. doi:10.1364/ao.45.002766

Katletz, S., Pfleger, M., Pühringer, H., Mikulics, M., Vieweg, N., Peters, O., … Wiesauer, K. (2012). Polarization sensitive terahertz imaging: detection of birefringence and optical axis. Optics Express, 20(21), 23025. doi:10.1364/oe.20.023025

Duvillaret, L., Garet, F., & Coutaz, J.-L. (2000). Influence of noise on the characterization of materials by terahertz time-domain spectroscopy. Journal of the Optical Society of America B, 17(3), 452. doi:10.1364/josab.17.000452

Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C. (1990). Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors. Journal of the Optical Society of America B, 7(10), 2006. doi:10.1364/josab.7.002006

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