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Improvement in the Accuracy of Dielectric Measurement of Open-Ended Coaxial Resonators by an Enhanced De-Embedding of the Coupling Network

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Improvement in the Accuracy of Dielectric Measurement of Open-Ended Coaxial Resonators by an Enhanced De-Embedding of the Coupling Network

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Canós Marín, AJ.; García Baños, B.; Catalá Civera, JM.; Penaranda-Foix, FL.; Gutiérrez Cano, JD. (2013). Improvement in the Accuracy of Dielectric Measurement of Open-Ended Coaxial Resonators by an Enhanced De-Embedding of the Coupling Network. IEEE Transactions on Microwave Theory and Techniques. 61(12):4636-4645. doi:10.1109/TMTT.2013.2285359

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10251/45119

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Title: Improvement in the Accuracy of Dielectric Measurement of Open-Ended Coaxial Resonators by an Enhanced De-Embedding of the Coupling Network
Author: Canós Marín, Antoni Josep García Baños, Beatriz Catalá Civera, José Manuel Penaranda-Foix, Felipe L. Gutiérrez Cano, José Daniel
UPV Unit: Universitat Politècnica de València. Departamento de Comunicaciones - Departament de Comunicacions
Universitat Politècnica de València. Instituto Universitario de Aplicaciones de las Tecnologías de la Información - Institut Universitari d'Aplicacions de les Tecnologies de la Informació
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Abstract:
An improvement of the accuracy of dielectric measurements of the open-ended coaxial resonator method is described. The technique is based on an empirical technique for de-embedding the coupling network excited by electric ...[+]
Subjects: Dielectric measurements , Open-ended coaxial resonators , Permittivity , Resonance frequency.
Copyrigths: Cerrado
Source:
IEEE Transactions on Microwave Theory and Techniques. (issn: 0018-9480 )
DOI: 10.1109/TMTT.2013.2285359
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publisher version: http://dx.doi.org/10.1109/TMTT.2013.2285359
Thanks:
The work of F. L. Penaranda-Foix was supported by the Conselleria d'Educacio of the Generalitat Valenciana for Economic Support (BEST/2012/010). This paper is an expanded paper from the IEEE MTT-S International Microwave ...[+]
Type: Artículo

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